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HEDL-5500, HEDL-5600, HEDL-6500, HEDL-9x00 Series
Motion Sensing Products, Optical Encoder Modules
Reliability Data Sheet
Description
The following cumulative test results have been obtained from testing performed at Avago Technologies Malaysia in accordance with the latest revisions of JEDEC standards Avago tests parts at the absolute maximum rated conditions recommended for the device. The actual performance you obtain from Avago parts depends on the electrical and environmental characteristics of your application but will probably be better than the performance outlined in Table 1.
Failure Rate Prediction
The failure rate of semiconductor devices is determined by the junction temperature of the device. The relationship between ambient temperature and actual junction temperature is given by the following: TJ(C) = TA(C) + JAPAVG where TA = ambient temperature in C JA = thermal resistance of junction-to-ambient in C/Watt PAVG = average power dissipated in Watt The estimated MTTF and failure rate at temperatures lower than the actual stress temperature can be determined by using an Arrhenius model for temperature acceleration. Results of such calculations are shown in the table below using an activation energy of 0.43eV (reference MIL-HDBK-217).
Table 1. Life Tests Demonstrated Performance Point Typical Performance Test Name High Temperature Operating Life Stress Test Conditions Vcc=5.0V, TA=00C Total Device Hours 30,000 Units Tested 30 Total Failed [3] 0 MTTF 32,700 Failure Rate (% /1 K Hours) 3.06
Table 2. Point Typical Performance in Time [1] Ambient Temperature (C) 00 90 80 70 60 50 40 Junction Temperature (C) 0 00 90 80 70 60 50 MTTF(1) 32,700 46,300 67,000 98,900 49,400 23,00 367,800 Failure Rate (% / 1K Hours) 3.06 2.5 .49 .0 0.66 0.43 0.27 Performance in Time [2] (90% Confidence) MTTF(2) 3,020 8,460 26,680 39,390 59,470 92,060 46,400 Failure Rate (% /1K Hours) 7.68 5.42 3.75 2.54 .68 .08 0.68
Notes: 1. The point typical MTTF (which represents 60% confidence level) is the total device hours divided by the number of failures. In the case of zero failures, one failure is assumed for this calculation. 2. The 90% Confidence MTTF represents the minimum level of reliability performance which is expected from 90% of all samples. This confidence interval is based on the statistics of the distribution of failures. The assumed distribution of failures is exponential. This particular distribution is commonly used in describing useful life failures. 3. Failures are catastrophic or parametric. Catastrophic failures are open, short, no logic output, no dynamic parameters while parametric failures are failures to meet an electrical characteristic as specified in product catalog such as output voltage, duty or state errors.
Example of Failure Rate Calculation
Assume a device operating 8 hours/day, 5 days/week. The utilization factor, given 168 hours/week is: (8 hours/day) x (5 days/week) / (168 hours/week) = 0.25 The point failure rate per year (8760 hours) at 50C ambient temperature is: (0.43% / 1K hours) x 0.25 X (8760 hours/year) = 0.94% per year Similarly, 90% confidence level failure rate per year at 50C: (1.08% / 1K hours) X 0.25 X (8760 hours/year) = 2.36% per year Table 3. Environmental Tests Test Name Storage Temperature Cycle Wet High Temperature Storage life Low Temperature Storage Life Test Conditions -40C to 00C, 5min dwell time. 5 min transfer. 000 cycles TA=85C, RH=85%, 000 hours TA=-40C, 000 hours Units Tested 90 90 90 Unit Failed 0 0 0
For product information and a complete list of distributors, please go to our web site:
www.avagotech.com
Avago, Avago Technologies, and the A logo are trademarks of Avago Technologies, Limited in the United States and other countries. Data subject to change. Copyright (c) 2006 Avago Technologies Limited. All rights reserved. AV0-0682EN - December 9, 2006

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